| dc.contributor.author |
Dahlgren, Henrich |
en_US |
| dc.contributor.author |
Lund Jensen, Rasmus |
en_US |
| dc.contributor.author |
Valentin, Finn |
en_US |
| dc.date.accessioned |
2009-02-04T10:24:45Z |
|
| dc.date.available |
2009-02-04T10:24:45Z |
|
| dc.date.issued |
2004-12-17T00:00:00Z |
en_US |
| dc.identifier.isbn |
8791549035 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/10398/6772 |
|
| dc.description.abstract |
This paper deals with methodological issues of assessing the composition and level of
heterogeneity of firms’ intellectual assets. It develops an original metric - referred to as
the H-index - for measuring heterogeneity using data extracted from patent documents.
The main purpose is to improve the characterisation of research activities within firms
in the biotechnology sector. Although the H-index grew out of research on biotech
firms, the metric carries broader relevance for all patent-intensive industries. The
measurement and calculation of the H-index is illustrated using some empirical
examples from our preliminary study on Scandinavian biotech firms. |
en_US |
| dc.format.extent |
17 s. |
en_US |
| dc.language |
eng |
en_US |
| dc.relation.ispartofseries |
Biotech Business Working Paper;2004-004 |
en_US |
| dc.subject.other |
kep |
en_US |
| dc.title |
Heterogeneity of Intellectual Assets |
en_US |
| dc.type |
wp |
en_US |
| dc.accessionstatus |
modt04dec17 miel |
en_US |
| dc.contributor.corporation |
Copenhagen Business School. CBS |
en_US |
| dc.contributor.corporationshort |
Research Centre on Biotech Business |
en_US |
| dc.contributor.department |
Institut for Industriøkonomi og Virksomhedsstrategi |
en_US |
| dc.contributor.departmentshort |
CEBI |
en_US |
| dc.contributor.departmentuk |
Department of Industrial Economics & Strategy |
en_US |
| dc.contributor.departmentukshort |
IVS |
en_US |
| dc.idnumber |
8791549035 |
en_US |
| dc.publisher.city |
København |
en_US |
| dc.publisher.year |
2004 |
en_US |
| dc.title.subtitle |
An Empirically Based Research Method for Identification and Measurement Using Patent Data |
en_US |